Noise as a tool for studying materials : 2-4 June, 2003, Santa Fe, New Mexico, USA / Michael B. Weissman, Nathan E. Israeloff, A. Shulim Kogan, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ... [et al.] ; published by SPIE--the International Society for Optical Engineering.

Contributor(s): Weissman, Michael B | Israeloff, Nathan E. (Nathan Eli), 1961- | Kogan, A. Shulim | Society of Photo-optical Instrumentation Engineers
Language: English Series: Proceedings of SPIE--the International Society for Optical Engineering: v. 5112.Publisher: Bellingham, Wash. : SPIE, c2003Description: x, 346 pages : illustrations ; 28 cmContent type: text Media type: unmediated Carrier type: ncISBN: 0819449725Subject(s): Random noise theory -- Congresses | Electronic noise -- Congresses | Materials -- Testing -- CongressesDDC classification: 620.11 LOC classification: Q380 | .N65 2003
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Item type Current location Home library Call number Status Date due Barcode Item holds
CONFERENCE PROCEEDING CONFERENCE PROCEEDING COLLEGE LIBRARY
COLLEGE LIBRARY
SUBJECT REFERENCE
620.11 N698 2003 (Browse shelf) Available CITU-CL-36621
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Includes bibliographical references and author index.

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