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Noise as a tool for studying materials : 2-4 June, 2003, Santa Fe, New Mexico, USA / Michael B. Weissman, Nathan E. Israeloff, A. Shulim Kogan, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ... [et al.] ; published by SPIE--the International Society for Optical Engineering. - x, 346 pages : illustrations ; 28 cm. - SPIE proceedings series ; v. 5112 . - Proceedings of SPIE--the International Society for Optical Engineering ; v. 5112. .

Includes bibliographical references and author index.

ISBN: 0819449725

LCCN: 2004296401

Subjects--Topical Terms:
Random noise theory--Congresses.
Electronic noise--Congresses.
Materials--Testing--Congresses.

LC Class. No.: Q380 / .N65 2003

Dewey Class. No.: 620.11