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_c51111 _d51111 |
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| 001 | 13471688 | ||
| 003 | CITU | ||
| 005 | 20240928085606.0 | ||
| 008 | 040128s2003 waua b 101 0 eng d | ||
| 010 | _a 2004296401 | ||
| 020 | _a0819449725 | ||
| 035 | _a(OCoLC)ocm52589065 | ||
| 040 |
_aCITU LRAC _cLHL _dDLC _beng |
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| 041 | _aeng | ||
| 042 | _alccopycat | ||
| 050 | 0 | 0 |
_aQ380 _b.N65 2003 |
| 082 | 0 | 0 |
_a620.11 _222 |
| 245 | 0 | 0 |
_aNoise as a tool for studying materials : _b2-4 June, 2003, Santa Fe, New Mexico, USA / _cMichael B. Weissman, Nathan E. Israeloff, A. Shulim Kogan, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ... [et al.] ; published by SPIE--the International Society for Optical Engineering. |
| 264 | 1 |
_aBellingham, Wash. : _bSPIE, _cc2003. |
|
| 300 |
_ax, 346 pages : _billustrations ; _c28 cm. |
||
| 336 |
_atext _btxt _2rdacontent |
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| 337 |
_aunmediated _bn _2rdamedia |
||
| 338 |
_2volume _anc _brdacarrier |
||
| 490 | 1 |
_aSPIE proceedings series ; _vv. 5112 |
|
| 504 | _aIncludes bibliographical references and author index. | ||
| 650 | 0 |
_aRandom noise theory _vCongresses. |
|
| 650 | 0 |
_aElectronic noise _vCongresses. |
|
| 650 | 0 |
_aMaterials _xTesting _vCongresses. |
|
| 700 | 1 | _aWeissman, Michael B. | |
| 700 | 1 |
_aIsraeloff, Nathan E. _q(Nathan Eli), _d1961- |
|
| 700 | 1 | _aKogan, A. Shulim. | |
| 710 | 2 | _aSociety of Photo-optical Instrumentation Engineers. | |
| 830 | 0 |
_aProceedings of SPIE--the International Society for Optical Engineering ; _vv. 5112. |
|
| 906 |
_a7 _bcbc _ccopycat _d2 _encip _f20 _gy-gencatlg |
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| 942 |
_2ddc _cCP |
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