X-parameters : characterization, modeling, and design of nonlinear RF and microwave components / David E. Root, Agilent Technologies Inc., Jan Verspecht, Agilent Technologies Inc., Jason Horn, Agilent Technologies Inc., Mihai Marcu, Agilent Technologies Inc.

By: Root, David E
Contributor(s): Verspecht, Jan | Horn, Jason | Marcu, Mihai
Language: English Series: The Cambridge RF and microwave engineering seriesPublisher: Cambridge, United Kingdom : Cambridge University Press, 2013Description: 1 online resource (xi, 219 pages) : illustrationsContent type: text Media type: computer Carrier type: online resourceISBN: 9781139042970Subject(s): Microwave circuits -- Design and construction -- Mathematics | Electric circuits, Nonlinear -- Design and construction -- Mathematics | Parametric devices -- Design and construction -- Mathematics | Differential equations | TECHNOLOGY & ENGINEERING / MicrowavesGenre/Form: Electronic books.DDC classification: 621.3841/2 Online resources: Full text available from Cambridge University Press Click here to view
Contents:
1. S-parameters; 2. X-parameters; 3. Small-signal sensitivities in the X-parameters; 4. X-parameter measurements; 5. Multi-tone multi-port X-parameters; 6. Memory.
Summary: "This is the definitive guide to X-parameters, written by the original inventors and developers of this powerful new paradigm for nonlinear RF and microwave components and systems. Learn how to use X-parameters to overcome intricate problems in nonlinear RF and microwave engineering. The general theory behind X-parameters is carefully and intuitively introduced, and then simplified down to specific, practical cases, providing you with useful approximations that will greatly reduce the complexity of measuring, modeling and designing for nonlinear regimes of operation. Containing real-world case studies, definitions of standard symbols and notation, detailed derivations within the appendices, and exercises with solutions, this is the definitive stand-alone reference for researchers, engineers, scientists and students looking to remain on the cutting-edge of RF and microwave engineering"-- Provided by publisher.
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Item type Current location Home library Call number Status Date due Barcode Item holds
EBOOK EBOOK COLLEGE LIBRARY
COLLEGE LIBRARY
621.38412 X1 2013 (Browse shelf) Available CL-46056
Total holds: 0

Includes bibliographical references.

1. S-parameters; 2. X-parameters; 3. Small-signal sensitivities in the X-parameters; 4. X-parameter measurements; 5. Multi-tone multi-port X-parameters; 6. Memory.

"This is the definitive guide to X-parameters, written by the original inventors and developers of this powerful new paradigm for nonlinear RF and microwave components and systems. Learn how to use X-parameters to overcome intricate problems in nonlinear RF and microwave engineering. The general theory behind X-parameters is carefully and intuitively introduced, and then simplified down to specific, practical cases, providing you with useful approximations that will greatly reduce the complexity of measuring, modeling and designing for nonlinear regimes of operation. Containing real-world case studies, definitions of standard symbols and notation, detailed derivations within the appendices, and exercises with solutions, this is the definitive stand-alone reference for researchers, engineers, scientists and students looking to remain on the cutting-edge of RF and microwave engineering"-- Provided by publisher.

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