Noise as a tool for studying materials :  2-4 June, 2003, Santa Fe, New Mexico, USA / 
Michael B. Weissman, Nathan E. Israeloff, A. Shulim Kogan, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ... [et al.] ; published by SPIE--the International Society for Optical Engineering. 
 - x, 346 pages :  illustrations ;  28 cm. 
 - SPIE proceedings series ;  v. 5112 .
 - Proceedings of SPIE--the International Society for Optical Engineering ;  v. 5112. .
<br/><br/>Includes bibliographical references and author index. 
<br/><br/><label>ISBN: </label>0819449725 
<br/><br/><label>LCCN: </label>2004296401 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Random noise theory--Congresses.<br/>Electronic noise--Congresses.<br/>Materials--Testing--Congresses.
<br/><br/><label>LC Class. No.: </label>Q380  / .N65 2003 
<br/><br/><label>Dewey Class. No.: </label>620.11