Speckle metrology / edited by Robert K. Erf.

Contributor(s): Erf, Robert K
Language: English Series: Quantum electronics--principles and applicationsPublisher: New York : Academic Press, 1978Description: xiv, 331 pages : illustrations ; 24 cmContent type: text Media type: unmediated Carrier type: volume ISBN: 0122413601Subject(s): Speckle metrologyDDC classification: 621.36 LOC classification: TA418.7 | .S67
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Item type Current location Home library Call number Status Date due Barcode Item holds
BOOK BOOK COLLEGE LIBRARY
COLLEGE LIBRARY
SUBJECT REFERENCE 		621.36 Sp31 1978 (Browse shelf) Available CITU-CL-19805
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Includes bibliographical references and index.

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